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Active Power
Cycling Test
In power electronics the demand on
highly reliable and cost effective systems is the
present situation. To fulfill these requirements,
precise lifetime models have to be developed. An
essential element is a good data basis generated by
tests. The semiconductor's electrical and thermal
joining is best examined by active power cycling
tests. The device under test (DUT) is heated and
cooled by its own power loss characteristic. The
accelerated aging is mainly driven by diffusion
processes and thermo-mechanical stress. The result is
a degraded electrical and/ or thermal contact. Both
can easily be monitored. If the power cycling is
continued till end of life, the physics of failure
method will help to design an appropriate lifetime
model. At least wear-out failures are in the focus.
Competitive testing of different technologies or
assembly parameters ensures comparability to other
tests. Parallel testing of identical devices
represents the statistical distribution.
The PCT3 power cycling test system offers a wide range
of applications. High flexibility associated with
automatic start-up processes contribute to that.
Applications
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Research
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Development
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Quality management
Heating and
Cooling
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Heating current up to 400A,
optional up to 800A
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Heating voltage up to 30V,
optional 35V
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Easy to use and low cost load
switches
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Tempering unit
cooling power 20kW, heating power 9kW
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Coolant temperature up to 150°C
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Open or closed hydraulic
secondary circuit system
maximum absolute pressure 10bar
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Coolant pressure and flow rate
sensors
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Automatic refilling of coolant
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Self adjusting temperature
control
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Accepts water/ glycol mixture
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Test chamber with drawer for cold
plate and DUTs
Measurement
Features
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Various DUTs possible:
Diode, IGBT, MOSFET, JFET, BJT
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Different test strategies from
application near (fixed heating current) to
scientific (fixed temperature swing)
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Cycling time 0.1 to 3600s
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Indirect junction temperature
measurement principle for DUTs, input voltage
-10 to +10V
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Individual gate voltage/ base
current control
for fine tuning of the heating power of DUTs
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Gate voltage -20 to +20V
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Base current -100 to +100mA
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Measurement current -100 to
+100mA
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Individual Pt100 temperature
sensors for DUTs
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Global Pt100 temperature
measurement
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Automatic temperature/ voltage
calibration for indirect temperature measurement
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Automatic temperature swing
adjustment
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Control of the individual
temperature swing
for each DUT by gate voltage/ base current
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Synchronous data logging of up to
20 DUTs
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Logging of heating phase
(voltage over time) cycle by cycle
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Logging of cooling phase
(temperature over time) cycle by cycle
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User interface to set timing
intervals
for the fine tuning of the indirect temperature
measurement
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Calculation of heating power,
temperature swing and thermal resistance
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Supervision of DUTs parameters
like heating power, heating voltage, coolant
temperature, global and individual external
temperature sensors, minimum and maximum
temperature, temperature swing, gate leakage
current, base current and measurement current
Post Calculations
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Post calculation of thermal
impedance cycle
by cycle (optional)
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Display of Foster and Cauer
equivalent network values over cycles (optional)
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Identification of thermal
coupling among different DUTs in one setup,
e.g. devices in a B6 bridge
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Different post data processing
possibilities to enhance data quality
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Tools to proof data quality in
terms of measurement interference
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Data reduction functions
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Data export functions
Miscellaneous
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Modular design of the data
acquisition
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Integrated computer with
uninterrupted
power supply for robust data storage and
visualization
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Single file project data
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Emergency shut down (hand-held
emergency stop, water alarm, smoke detector)
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Quick connectors with double
shut-off for all hydraulics
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Quick connectors for heating
power
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Cold plate ready to use
(optional)
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Complete
power cycling test system with minimal
installation overhead
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